SDCOM Demo at your desk

Your ultra-fast, top surface measuring crystal orientation in a compact package, able to measure any single crystal with a diameter between 2mm to 300mm. SDCOM uses the azimuthal scan method to precisely determine the complete lattice orientation of single crystals in just one measuring rotation – taking only a few seconds. Suitable for both research, production and quality control, the versatile and accessible SDCOM fits easily into a wide range of wafer and ingot process steps while having minimal operational costs due to no requirement for water cooling. SDCOM is capable of measuring the crystal orientation of any single crystalline material. In this Demo, we reveal the measurement procedures for different types of samples such as irregular single crystalline samples, wafer samples and small samples. The procedure is done with the help of the XRD Suite, both a powerful and intuitive software, making it convenient and easy to operate for a range of users.